The 13^th International Symposium on Electron Beam Ion Sources and Traps, EBIST2018, will be held during October 23 - 27, 2018 at the 103 room of  Guanghua Twin-Tower on the Handan campus of Fudan University in Shanghai, China, organized by the Shanghai EBIT laboratory.

The EBIST symposium has been held every three to four years since 1977. The goal of this symposium is to discuss the design, development, applications of electron beam ion sources and traps, and the physics with highly charged ions.

The EBIST2018 will cover the following topics:

1. Progress and status of EBIS/T facilities,

2. Atomic spectroscopy of highly charged ions,

3. Charge-exchange and surface interaction with highly charged ions,

4. Charge breeding of stable and radioactive isotopes,

5. Nuclear physics with highly charged ions.

Important Dates:

Registration opens: June 1, 2018

Abstract submission deadline: September 1, 2018

We look forward to seeing you at Fudan University!

Local Organizers:

Ke Yao, Yang Yang, Liu Yang,

Jun Xiao, Yang Shen, Baoren Wei,

Zhimin Hu, Zhaowei Liu, Roger Hutton, Yaming Zou

International Advisory Board:

Edward Beebe               BNL, USA        

Alain Lapierre                MSU,USA           

Yuri Ralchenko              NIST, USA            

Tom Lockard                 LLNL, USA        

Oliver Kester                 TRIUMF, Canada      

Thomas Stöhlker          GSI, Germany      

José Crespo                  MPI-K Germany       

Evgeny D. Donets         JINR, Russia         

Nobuyuki Nakamura    UEC, Japan        

Yaming Zou                  Fudan University, China